Activity: Talk or presentation types › Invited talk
Description
Prof. Andersson delivered this presentation at the 7th International Workshop on High-Resolution Depth Profiling in Singapore.
The workshop provides an informal forum for exchange of ideas, discussion of problems and presentation of new results in the field of Low and Medium Energy Ion Scattering, RBS and ERDA and other techniques with atomic layer depth resolution, Narrow Nuclear Resonance Profiling, as well as surface structure determinations using ion beams. Contributions are also solicited from fields that have an impact on, and can be impacted by, the topics above.
Period
2013
Event title
7th International Workshop on High-Resolution Depth Profiling