Details
Description
DOI: https://doi.org/10.25957/flinders.afm.dimension
Atomic force microscope
Specifications:
-Max. scan X-Y size 90µm x 90 µm typical
-Max. Z range 9.5 µm
-Lateral resolution 5-10 nm (dependant on AFM tip diameter, vertical resolution less than 1 nm.
-Tapping mode, non-contact mode, contact mode, Force-distance spectroscopy, Peak force tapping, piezoresponse force and electrostatic force mapping; conductive mapping
-AFM can also operate in numerous imaging modes which allow the measurement of surface adhesion, stiffness, sample conductivity, and electrical properties on the nanoscale
-Example of types of materials analysed by AFM in the FMMA include, for example, 2D materials, nanotubes, nanoparticles, polymers, metals, and semiconductors
Atomic force microscope
Specifications:
-Max. scan X-Y size 90µm x 90 µm typical
-Max. Z range 9.5 µm
-Lateral resolution 5-10 nm (dependant on AFM tip diameter, vertical resolution less than 1 nm.
-Tapping mode, non-contact mode, contact mode, Force-distance spectroscopy, Peak force tapping, piezoresponse force and electrostatic force mapping; conductive mapping
-AFM can also operate in numerous imaging modes which allow the measurement of surface adhesion, stiffness, sample conductivity, and electrical properties on the nanoscale
-Example of types of materials analysed by AFM in the FMMA include, for example, 2D materials, nanotubes, nanoparticles, polymers, metals, and semiconductors
Details
| Name | Bruker FastScan AFM |
|---|---|
| Acquisition date | 1/01/12 |
| Manufacturers | Bruker Corporation |
Keywords
- QC Physics
- AFM
- atomic force microscopy
- force spectroscopy
- topography
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