FEI Inspect F50 Field Emission SEM

    Facility/equipment: Equipment

    Details

    Description

    Scanning Electron Microscopy (SEM) uses a beam of electrons to image to a much higher resolution than is possible with an optical microscope. High resolution SEM of samples can be combined with elemental mapping using Energy Dispersive X-ray spectroscopy (EDX). An Electron Backscatter Diffraction (EBSD) detector is also installed allowing measurements of grain orientation and boundaries in crystalline samples.

    FEI Inspect F50 Field Emission SEM

    -Secondary Electron detector
    -Backscatter Electron detector
    -Amatek EDAX EDS detector
    -EDAX EBSD detector

    Funding:
    Government of South Australia
    Microscopy Australia
    Australian Research Council
    https://dataportal.arc.gov.au/NCGP/Web/Grant/Grant/LE140100040

    Details

    NameFEI
    Acquisition date28/01/15
    ManufacturersFEI Company

    Keywords

    • QC Physics
    • scanning electron microscope
    • Nanotechnology

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