Scanning Electron Microscopy (SEM) uses a beam of electrons to image to a much higher resolution than is possible with an optical microscope. High resolution SEM of samples can be combined with elemental mapping using Energy Dispersive X-ray spectroscopy (EDX). An Electron Backscatter Diffraction (EBSD) detector is also installed allowing measurements of grain orientation and boundaries in crystalline samples.
FEI Inspect F50 Field Emission SEM
-Secondary Electron detector
-Backscatter Electron detector
-Amatek EDAX EDS detector
-EDAX EBSD detector
Funding:
Government of South Australia
Microscopy Australia
Australian Research Council
https://dataportal.arc.gov.au/NCGP/Web/Grant/Grant/LE140100040
Name | FEI |
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Acquisition date | 28/01/15 |
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Manufacturers | FEI Company |
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- QC Physics
- scanning electron microscope
- Nanotechnology