Research output per year
Research output per year
Details
Description
DOI: https://doi.org/10.25957/flinders.sem
Scanning Electron Microscopy (SEM) uses a beam of electrons to image to a much higher resolution than is possible with an optical microscope. High resolution SEM of samples can be combined with elemental mapping using Energy Dispersive X-ray spectroscopy (EDX). An Electron Backscatter Diffraction (EBSD) detector is also installed allowing measurements of grain orientation and boundaries in crystalline samples.
-Secondary Electron detector
-Backscatter Electron detector
-Amatek EDAX EDS detector
-EDAX EBSD detector
-Energy-dispersive X-ray Spectroscopy
Scanning Electron Microscopy (SEM) uses a beam of electrons to image to a much higher resolution than is possible with an optical microscope. High resolution SEM of samples can be combined with elemental mapping using Energy Dispersive X-ray spectroscopy (EDX). An Electron Backscatter Diffraction (EBSD) detector is also installed allowing measurements of grain orientation and boundaries in crystalline samples.
-Secondary Electron detector
-Backscatter Electron detector
-Amatek EDAX EDS detector
-EDAX EBSD detector
-Energy-dispersive X-ray Spectroscopy
Details
| Name | FEI Inspect F50 Field Emission SEM |
|---|---|
| Acquisition date | 28/01/15 |
| Manufacturers | FEI Company |
Keywords
- QC Physics
- scanning electron microscope
- SEM
- EDS
- EDX
- EDXS
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Research output
- 2 Article
-
Investigation of different degradation pathways for organic photovoltaics at different temperatures
Kirk, B. P., Alghamdi, A. R., Griffith, M. J., Pan, X., Jevric, M., Lewis, D. A., Andersson, G. G. & Andersson, M. R., 18 Apr 2024, In: Materials Advances. 5, 10, p. 4438-4451 14 p.Research output: Contribution to journal › Article › peer-review
Open AccessFile3 Citations (Scopus)91 Downloads (Pure) -
Transforming Spirulina maxima Biomass into Ultrathin Bioactive Coatings Using an Atmospheric Plasma Jet: A New Approach to Healing of Infected Wounds
Pham, T., Nguyen, T. T., Nguyen, N. H., Hayles, A., Li, W., Pham, D. Q., Nguyen, C. K., Nguyen, T., Vongsvivut, J., Ninan, N., Sabri, Y., Zhang, W., Vasilev, K. & Truong, V. K., 26 Sept 2024, In: Small. 20, 39, 16 p., 2305469.Research output: Contribution to journal › Article › peer-review
Open AccessFile17 Citations (Scopus)178 Downloads (Pure)