DOI: https://doi.org/10.25957/flinders.mies
The combination of four electron spectroscopy techniques allows measuring the elemental and chemical composition, the composition and electronic structure of the outermost layer and the valence and conduction band structure of semiconductors.
Instrument for electron spectroscopy
- SPECS electron and ion energy analyser
- source for metastable helium atoms (19.8 eV)
- source for UV light (21.2 eV)
- X-ray source (Al and Mg anode)
- inverse photoemission spectrometer and electron source
- ion source 1 – 5 keV for He, Ar and Ne
- sample holder for solids with cooling and heating between – 196 C to 800 C
- sample holder for liquid surfaces
- evaporators for organic and inorganic substances
- manufacturer: SPECS (Germany)
- FTIR spectrometer (Bruker)
| Name | Metastable Induced Electron Spectroscopy (MIES) |
|---|
| Acquisition date | 1/01/10 |
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- QC Physics
- MIES
- XPS
- UPS
- IPES
- LEIS
- FTIR