Neutral Impact Collision Ion Scattering Spectroscopy (NICISS)

    Facility/equipment: Equipment

    Details

    Description

    DOI: https://doi.org/10.25957/flinders.niciss

    Instrument for high resolution depth profiling with a depth resolution of 2 – 3 Å close to the surface.

    Instrument for ion scattering spectroscopy
    - ion source 1 – 10 keV for gases, Nonsequitur
    - Time-of-flight analyser
    - sample holder for solids with cooling and heating between – 196 C to 800 C
    - sample holder for liquid surfaces
    - manufacturer: SPECS (Germany)

    Details

    NameNeutral Impact Collision Ion Scattering Spectroscopy
    Acquisition date1/01/16
    ManufacturersSPECS GmbH

    Keywords

    • QC Physics
    • NICISS
    • depth profiling

    Fingerprint

    Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.