Scienta Omicron NanoESCA III Photoemission Electron Microscope (PEEM)

https://doi.org/10.25957/flinders.nanoesca3

The NanoESCA III Photoemission Electron Microscope (PEEM) images surfaces by focussing and detecting electrons emitted from a material following irradiation with UV and X-ray light. The primary capabilities include spatial mapping of the surface morphology, elemental and chemical compositions and the electron band-structure of the materials.

Key instrument capabilities:
• PEEM energy-filtered imaging (<50nm lateral resolution)
• Small-spot XPS (FOV ~180μm)
• XPS imaging (XPEEM)
• ARPES
• Liquid helium cooled sample stage
o Sample temperatures in the range 20-400 K.

Here we have multiple light sources available:
• Hg (244-254 nm; 4.9-5.1eV)
• HeI (21.2eV) [HIS 14 HD VUV]
• HeII (40.8eV) [HIS 14 HD VUV]
• monochromated X-rays
o Al Kα (1486 eV) to probe the valance and core-level structure of materials.

Sample preparation module:
• Low-energy electron diffraction (LEED) - BDL600IR-LMX, OCI Vacuum Microengineering Inc.
• Sample cleaning through ion sputtering (Ion Source IS 40C1, PREVAC)
• Crystal cleaving in-vacuo
• Sample heating/cooling in manipulator (120-880 K)