Research output per year
Research output per year
Details
Description
https://doi.org/10.25957/flinders.nanoesca3
The NanoESCA III Photoemission Electron Microscope (PEEM) images surfaces by focussing and detecting electrons emitted from a material following irradiation with UV and X-ray light. The primary capabilities include spatial mapping of the surface morphology, elemental and chemical compositions and the electron band-structure of the materials.
Key instrument capabilities:
• PEEM energy-filtered imaging (<50nm lateral resolution)
• Small-spot XPS (FOV ~180μm)
• XPS imaging (XPEEM)
• ARPES
• Liquid helium cooled sample stage
o Sample temperatures in the range 20-400 K.
Here we have multiple light sources available:
• Hg (244-254 nm; 4.9-5.1eV)
• HeI (21.2eV) [HIS 14 HD VUV]
• HeII (40.8eV) [HIS 14 HD VUV]
• monochromated X-rays
o Al Kα (1486 eV) to probe the valance and core-level structure of materials.
Sample preparation module:
• Low-energy electron diffraction (LEED) - BDL600IR-LMX, OCI Vacuum Microengineering Inc.
• Sample cleaning through ion sputtering (Ion Source IS 40C1, PREVAC)
• Crystal cleaving in-vacuo
• Sample heating/cooling in manipulator (120-880 K)
The NanoESCA III Photoemission Electron Microscope (PEEM) images surfaces by focussing and detecting electrons emitted from a material following irradiation with UV and X-ray light. The primary capabilities include spatial mapping of the surface morphology, elemental and chemical compositions and the electron band-structure of the materials.
Key instrument capabilities:
• PEEM energy-filtered imaging (<50nm lateral resolution)
• Small-spot XPS (FOV ~180μm)
• XPS imaging (XPEEM)
• ARPES
• Liquid helium cooled sample stage
o Sample temperatures in the range 20-400 K.
Here we have multiple light sources available:
• Hg (244-254 nm; 4.9-5.1eV)
• HeI (21.2eV) [HIS 14 HD VUV]
• HeII (40.8eV) [HIS 14 HD VUV]
• monochromated X-rays
o Al Kα (1486 eV) to probe the valance and core-level structure of materials.
Sample preparation module:
• Low-energy electron diffraction (LEED) - BDL600IR-LMX, OCI Vacuum Microengineering Inc.
• Sample cleaning through ion sputtering (Ion Source IS 40C1, PREVAC)
• Crystal cleaving in-vacuo
• Sample heating/cooling in manipulator (120-880 K)
Details
| Name | Scienta Omicron NanoESCA III Photoemission Electron Microscope |
|---|---|
| Acquisition date | 1/01/23 |
| Manufacturers | Scienta Omicron GmbH |
Keywords
- QC Physics
- NanoESCA
- PEEM
- photoemission electron microscopy
- UPS
- ultraviolet photoelectron spectroscopy
- ARPES
- angle resolved photoelectron spectroscopy
- LEED
- low energy electron diffraction
- UHV
- ultra high vacuum
- band structure
- density of states
- ARUPS
- angle resolved ultraviolet photoelectron spectroscopy
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Research output
- 1 Letter
-
Tuning the low-energy band structure in twisted bilayer WSe2
Vu, T. H. Y., Clark, O. J., Jo, N. H., Blyth, J., Li, Q., Jozwiak, C., Bostwick, A., Muir, J. B., Jia, L., Davis, J. A., Di Bernardo, I., abo, A. G. Č., Xing, K., Zhao, W., Ryu, S. H., Lee, S. H., Mao, Z., Watanabe, K., Taniguchi, T. & Chambers, B. A. & 4 others, , 14 Oct 2025, In: Physical Review B. 112, 16, p. L1611171-L1611178 8 p.Research output: Contribution to journal › Letter › peer-review
1 Citation (Scopus)