Details
Description
DOI: https://doi.org/10.25957/flinders.vtspm.xa
The Scienta Omicron Variable Temperature UHV SPM (VT AFM XA) is used to gain atomic resolution images of sample surfaces providing insight into surface morphology, topology, and the surface density of states at a range of temperatures (20K – 500K). Tips and samples are exchanged under UHV using the transfer arm and carousel. The instrument is connected the PEEM sample preparation chamber and can be used independently or in preparation for PEEM measurements.
UHV Atomic Force Microscopy (AFM)
UHV Non Contact Force Microscopy (NCAFM)
UHV Scanning Tunnelling Microscopy (STM) (<1pA – 330nA)
UHV Scanning Tunnelling Spectroscopy (STS) (<1pA – 330nA)
The Scienta Omicron Variable Temperature UHV SPM (VT AFM XA) is used to gain atomic resolution images of sample surfaces providing insight into surface morphology, topology, and the surface density of states at a range of temperatures (20K – 500K). Tips and samples are exchanged under UHV using the transfer arm and carousel. The instrument is connected the PEEM sample preparation chamber and can be used independently or in preparation for PEEM measurements.
UHV Atomic Force Microscopy (AFM)
UHV Non Contact Force Microscopy (NCAFM)
UHV Scanning Tunnelling Microscopy (STM) (<1pA – 330nA)
UHV Scanning Tunnelling Spectroscopy (STS) (<1pA – 330nA)
Details
| Name | Scienta Omicron VT SPM |
|---|---|
| Acquisition date | 1/01/23 |
| Manufacturers | Scienta Omicron GmbH |
Keywords
- QC Physics
- SPM
- scanning probe microscopy
- STM
- scanning tunnelling microscopy
- AFM
- atomic force microscopy
- NC-AFM
- non-contact atomic force microscopy
- C-AFM
- contact atomic force microscopy
- UHV
- ultra high vacuum
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