A method for production of cheap, reliable Pt-Ir tips

B. L. Rogers; J. G. Shapter; W. M. Skinner; K. Gascoigne

doi:10.1063/1.1150523

A method for production of cheap, reliable Pt-Ir tips

B. L. Rogers, J. G. Shapter, W. M. Skinner, K. Gascoigne

College of Science and Engineering

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

A new method of producing Pt-Ir tips for use in scanning tunneling microscopy is described. This reproducible method is simple, cheap, fast, and avoids the use of hazardous chemicals common in many other methods. Scanning electron microscopy, time of flight-secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy have been applied to understand both the chemical and morphological changes that occur as a result of the etching. The method has been demonstrated on both stock Pt-Ir wire and commercial tips and has been found to dramatically enhance image quality. It is also reusable on the same tip extending the lifetime of a single tip indefinitely.

Original language	English
Pages (from-to)	1702-1705
Number of pages	4
Journal	Review of Scientific Instruments
Volume	71
Issue number	4
DOIs	https://doi.org/10.1063/1.1150523
Publication status	Published - Apr 2000

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AB - A new method of producing Pt-Ir tips for use in scanning tunneling microscopy is described. This reproducible method is simple, cheap, fast, and avoids the use of hazardous chemicals common in many other methods. Scanning electron microscopy, time of flight-secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy have been applied to understand both the chemical and morphological changes that occur as a result of the etching. The method has been demonstrated on both stock Pt-Ir wire and commercial tips and has been found to dramatically enhance image quality. It is also reusable on the same tip extending the lifetime of a single tip indefinitely.

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A method for production of cheap, reliable Pt-Ir tips

Abstract

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