Original language | English |
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Title of host publication | FIB Nanostructures |
Publisher | Springer |
Pages | 205-240 |
Number of pages | 36 |
Volume | 20 |
ISBN (Print) | 9783319028736 |
Publication status | Published - 2013 |
Application of Ion Beam Processes to Scanning Probe Microscopy
Ashley Slattery, Christopher Gibson, Jamie Quinton
Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review