Application of Ion Beam Processes to Scanning Probe Microscopy

    Research output: Chapter in Book/Report/Conference proceedingChapter

    Original languageEnglish
    Title of host publicationFIB Nanostructures
    PublisherSpringer
    Pages205-240
    Number of pages36
    Volume20
    ISBN (Print)9783319028736
    Publication statusPublished - 2013

    Cite this