| Original language | English |
|---|---|
| Title of host publication | FIB Nanostructures |
| Publisher | Springer |
| Pages | 205-240 |
| Number of pages | 36 |
| Volume | 20 |
| ISBN (Print) | 9783319028736 |
| Publication status | Published - 2013 |
Application of Ion Beam Processes to Scanning Probe Microscopy
Ashley Slattery, Christopher Gibson, Jamie Quinton
Research output: Chapter in Book/Report/Conference proceeding › Chapter