Abstract
We have developed and proposed a model for reactive ion etching (RIE) process design of nickel oxide thin films using a computational materials design based on ab initio calculations. On etching NiO, we found that it was necessary to have hydrogen-based reactive gases in the initial state in order to enhance RIE (e.g.NH3, CH4). We strongly suggest the use of CH 4 or any H-based gas source other than CHF3 to enhance RIE process.
| Original language | English |
|---|---|
| Article number | 365210 |
| Number of pages | 7 |
| Journal | Journal of Physics: Condensed Matter |
| Volume | 19 |
| Issue number | 36 |
| DOIs | |
| Publication status | Published - 12 Sept 2007 |
| Externally published | Yes |
Fingerprint
Dive into the research topics of 'Applying computational nanomaterials design to the reactive ion etching of NiO thin films - A preliminary investigation'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver