TY - GEN
T1 - Bacterial attachment response to nanostructured titanium surfaces
AU - Truong, Vi Khanh
AU - Wang, James Y.
AU - Shurui, Wang
AU - Malherbe, Francois
AU - Berndt, Christopher C.
AU - Crawford, Russell J.
AU - Ivanova, Elena P.
PY - 2010
Y1 - 2010
N2 - The effect of sub-nanometric surface roughness of Ti thin films surfaces on the attachment of two human pathogenic bacteria, Staphylococcus aureus CIP 65.8T and Pseudomonas aeruginosa ATCC 9027, was studied. A magnetron sputtering thin film deposition system was used to control the titanium thin film thicknesses of 3 nm, 12 nm and 150 nm on silicon wafers with corresponding surface roughness parameters of Rq 0.14 nm, 0.38 nm and 5.55 nm (1 m 1 m scanning area). Analysis of bacterial retention profiles showed that the bacteria responded differently changes in the Ra and Rq (Ti thin film) surface roughness parameters of a less than 1 nm, with up to 2-3 times: more cells being retained on the surface, and elevated levels of extracellular polymeric substances being secreted on the Ti thin films, in particular on the surfaces with 0.14 nm (Rq) roughness.
AB - The effect of sub-nanometric surface roughness of Ti thin films surfaces on the attachment of two human pathogenic bacteria, Staphylococcus aureus CIP 65.8T and Pseudomonas aeruginosa ATCC 9027, was studied. A magnetron sputtering thin film deposition system was used to control the titanium thin film thicknesses of 3 nm, 12 nm and 150 nm on silicon wafers with corresponding surface roughness parameters of Rq 0.14 nm, 0.38 nm and 5.55 nm (1 m 1 m scanning area). Analysis of bacterial retention profiles showed that the bacteria responded differently changes in the Ra and Rq (Ti thin film) surface roughness parameters of a less than 1 nm, with up to 2-3 times: more cells being retained on the surface, and elevated levels of extracellular polymeric substances being secreted on the Ti thin films, in particular on the surfaces with 0.14 nm (Rq) roughness.
KW - Bacterial attachment
KW - Sub-nanometric surface morphology
KW - Titanium
UR - http://www.scopus.com/inward/record.url?scp=80555156689&partnerID=8YFLogxK
U2 - 10.1109/ICONN.2010.6045205
DO - 10.1109/ICONN.2010.6045205
M3 - Conference contribution
AN - SCOPUS:80555156689
SN - 9781424452620
T3 - ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology
SP - 253
EP - 256
BT - ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology
T2 - 2010 3rd International Conference on Nanoscience and Nanotechnology, ICONN 2010
Y2 - 22 February 2010 through 26 February 2010
ER -