Characterisation of 0.22 caliber rimfire gunshot residues by time-of-flight secondary ion mass spectrometry (TOF-SIMS): a preliminary study

John Coumbaros, K. Paul Kirkbride, Gunter Klass, William Skinner

Research output: Contribution to journalArticle

34 Citations (Scopus)

Abstract

The application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) for the characterisation of gunshot residue (GSR) from 0.22 caliber rimfire ammunition is reported. Results obtained by TOF-SIMS were compared with conventional scanning electron microscopy (SEM) studies. As could be expected, TOF-SIMS exhibited greater elemental sensitivity than SEM equipped with energy dispersive X-ray detection (SEM-EDX), and was also capable of detecting fragments characteristic of inorganic compounds. This preliminary study indicates that TOF-SIMS offers substantial potential for forensic GSR examinations as a complementary technique to SEM-EDX. In addition TOF-SIMS is applicable to the analysis of individual particles in the typical size range encountered in GSR casework.

Original languageEnglish
Pages (from-to)72-81
Number of pages10
JournalForensic Science International
Volume119
Issue number1
DOIs
Publication statusPublished - 1 Jun 2001
Externally publishedYes

Keywords

  • 0.22 Caliber ammunition
  • Gunshot residue
  • Scanning electron microscopy
  • Time-of-flight secondary ion mass spectrometry (TOF-SIMS)

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