Characterisation of 0.22 caliber rimfire gunshot residues by time-of-flight secondary ion mass spectrometry (TOF-SIMS): a preliminary study

John Coumbaros; K. Paul Kirkbride; Gunter Klass; William Skinner

doi:10.1016/S0379-0738(00)00421-7

Characterisation of 0.22 caliber rimfire gunshot residues by time-of-flight secondary ion mass spectrometry (TOF-SIMS): a preliminary study

John Coumbaros, K. Paul Kirkbride, Gunter Klass, William Skinner

Research output: Contribution to journal › Article › peer-review

39 Citations (Scopus)

Abstract

The application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) for the characterisation of gunshot residue (GSR) from 0.22 caliber rimfire ammunition is reported. Results obtained by TOF-SIMS were compared with conventional scanning electron microscopy (SEM) studies. As could be expected, TOF-SIMS exhibited greater elemental sensitivity than SEM equipped with energy dispersive X-ray detection (SEM-EDX), and was also capable of detecting fragments characteristic of inorganic compounds. This preliminary study indicates that TOF-SIMS offers substantial potential for forensic GSR examinations as a complementary technique to SEM-EDX. In addition TOF-SIMS is applicable to the analysis of individual particles in the typical size range encountered in GSR casework.

Original language	English
Pages (from-to)	72-81
Number of pages	10
Journal	Forensic Science International
Volume	119
Issue number	1
DOIs	https://doi.org/10.1016/S0379-0738(00)00421-7
Publication status	Published - 1 Jun 2001
Externally published	Yes

Keywords

0.22 Caliber ammunition
Gunshot residue
Scanning electron microscopy
Time-of-flight secondary ion mass spectrometry (TOF-SIMS)

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10.1016/S0379-0738(00)00421-7Licence: In Copyright

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title = "Characterisation of 0.22 caliber rimfire gunshot residues by time-of-flight secondary ion mass spectrometry (TOF-SIMS): a preliminary study",

abstract = "The application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) for the characterisation of gunshot residue (GSR) from 0.22 caliber rimfire ammunition is reported. Results obtained by TOF-SIMS were compared with conventional scanning electron microscopy (SEM) studies. As could be expected, TOF-SIMS exhibited greater elemental sensitivity than SEM equipped with energy dispersive X-ray detection (SEM-EDX), and was also capable of detecting fragments characteristic of inorganic compounds. This preliminary study indicates that TOF-SIMS offers substantial potential for forensic GSR examinations as a complementary technique to SEM-EDX. In addition TOF-SIMS is applicable to the analysis of individual particles in the typical size range encountered in GSR casework.",

keywords = "0.22 Caliber ammunition, Gunshot residue, Scanning electron microscopy, Time-of-flight secondary ion mass spectrometry (TOF-SIMS)",

author = "John Coumbaros and Kirkbride, {K. Paul} and Gunter Klass and William Skinner",

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T2 - a preliminary study

AU - Coumbaros, John

AU - Kirkbride, K. Paul

AU - Klass, Gunter

AU - Skinner, William

PY - 2001/6/1

Y1 - 2001/6/1

N2 - The application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) for the characterisation of gunshot residue (GSR) from 0.22 caliber rimfire ammunition is reported. Results obtained by TOF-SIMS were compared with conventional scanning electron microscopy (SEM) studies. As could be expected, TOF-SIMS exhibited greater elemental sensitivity than SEM equipped with energy dispersive X-ray detection (SEM-EDX), and was also capable of detecting fragments characteristic of inorganic compounds. This preliminary study indicates that TOF-SIMS offers substantial potential for forensic GSR examinations as a complementary technique to SEM-EDX. In addition TOF-SIMS is applicable to the analysis of individual particles in the typical size range encountered in GSR casework.

AB - The application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) for the characterisation of gunshot residue (GSR) from 0.22 caliber rimfire ammunition is reported. Results obtained by TOF-SIMS were compared with conventional scanning electron microscopy (SEM) studies. As could be expected, TOF-SIMS exhibited greater elemental sensitivity than SEM equipped with energy dispersive X-ray detection (SEM-EDX), and was also capable of detecting fragments characteristic of inorganic compounds. This preliminary study indicates that TOF-SIMS offers substantial potential for forensic GSR examinations as a complementary technique to SEM-EDX. In addition TOF-SIMS is applicable to the analysis of individual particles in the typical size range encountered in GSR casework.

KW - 0.22 Caliber ammunition

KW - Gunshot residue

KW - Scanning electron microscopy

KW - Time-of-flight secondary ion mass spectrometry (TOF-SIMS)

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Characterisation of 0.22 caliber rimfire gunshot residues by time-of-flight secondary ion mass spectrometry (TOF-SIMS): a preliminary study

Abstract

Keywords

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