Abstract
Many important technologies depend on applications of organic thin films. The properties of surfaces and interfaces of film/substrate structures are of particular importance. It is becoming apparent that the atomic force microscope (AFM) has much to offer, especially when in situ non-destructive characterization is required. The ability of AFM to provide high resolution topographical images is well-developed. Recent studies have shown that force vs. distance (F-d) analysis can map at high spatial resolution mechanical properties of organic films, as well as those of the substrate. The same mode will also provide quantitative information about adhesive interactions. A formalism has been developed, based on a series combination of linearly compliant elements, from which film thickness and elastic moduli can be inferred from the detailed structure of F-d curves. The methodology is illustrated for the native lipid layer on wool fibre and for the multilayer structure of magnetic tapes.
Original language | English |
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Pages (from-to) | 618-622 |
Number of pages | 5 |
Journal | Applied Surface Science |
Volume | 144-145 |
DOIs | |
Publication status | Published - Apr 1999 |
Externally published | Yes |
Keywords
- Atomic force microscopy
- Force-distance analysis
- Lipid layer
- Surface structure
- Thin-film analysis
- Wool fibre