Characterisation of vacuum (physical vapour) deposited Lumogen optical films

Jamie Scott Quinton, Alec Deslandes, A Bruce Wedding

Research output: Contribution to conferenceAbstractpeer-review

Abstract

The material and surface characterisation of Lumogen Yellow S optical thin films vacuum deposited on silicon dioxide surfaces is made using a range of analytical techniques. Differential scanning calorimetry (DSC) and thermo-gravimetric analysis (TGA) have been applied to determine the degree of crystallinity in the films. Ultraviolet-visible spectroscopy (UV-vis), x-ray diffraction (XRD) and scanning electron microscopy (SEM) are utilised to study the change in film structure with respect to deposition conditions. UV-vis and DSC/TGA results yield basic data on the melting point, absorption and emission spectra for the material while x-ray scattering is used to calibrate film thickness. XRD provides a more reliable probe of crystallinity and results show changes in crystal structure and growth after post-deposition treatment at elevated temperatures. Size quantification and the degree of crystallinity in the films is confirmed by direct SEM imaging showing the crystal formation on the film surface. Copyright (2005) Australian Institute of Physics
Original languageEnglish
Pages197-197
Number of pages1
Publication statusPublished - 2005
Event16th National Congress of the Australian Institute of Physics: Physics for the Nation - Australian National University, Canberra, Australia
Duration: 30 Jan 20054 Feb 2005
https://trove.nla.gov.au/work/9765343/version/17607408?keyword=16th%20National%20Congress%20of%20the%20Australian%20Institute%20of%20Physics (Trove record for congress handbook and abstracts)

Conference

Conference16th National Congress of the Australian Institute of Physics
CountryAustralia
CityCanberra
Period30/01/054/02/05
Internet address

Fingerprint Dive into the research topics of 'Characterisation of vacuum (physical vapour) deposited Lumogen optical films'. Together they form a unique fingerprint.

Cite this