Abstract
The material and surface characterisation of Lumogen Yellow S optical thin films vacuum deposited on silicon dioxide surfaces is made using a range of analytical techniques. Differential scanning calorimetry (DSC) and thermo-gravimetric analysis (TGA) have been applied to determine the degree of crystallinity in the films. Ultraviolet-visible spectroscopy (UV-vis), x-ray diffraction (XRD) and scanning electron microscopy (SEM) are utilised to study the change in film structure with respect to deposition conditions. UV-vis and DSC/TGA results yield basic data on the melting point, absorption and emission spectra for the material while x-ray scattering is used to calibrate film thickness. XRD provides a more reliable probe of crystallinity and results show changes in crystal structure and growth after post-deposition treatment at elevated temperatures. Size quantification and the degree of crystallinity in the films is confirmed by direct SEM imaging showing the crystal formation on the film surface. Copyright (2005) Australian Institute of Physics
| Original language | English |
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| Pages | 197-197 |
| Number of pages | 1 |
| Publication status | Published - 2005 |
| Event | 16th National Congress of the Australian Institute of Physics: Physics for the Nation - Australian National University, Canberra, Australia Duration: 30 Jan 2005 → 4 Feb 2005 https://trove.nla.gov.au/work/9765343/version/17607408?keyword=16th%20National%20Congress%20of%20the%20Australian%20Institute%20of%20Physics (Trove record for congress handbook and abstracts) |
Conference
| Conference | 16th National Congress of the Australian Institute of Physics |
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| Country | Australia |
| City | Canberra |
| Period | 30/01/05 → 4/02/05 |
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