Abstract
Topological defects in ferroic materials can exhibit intrinsic properties that differ from the bulk. Here, structural and electronic variations of non-prominent (W’) ferroelastic twin domain walls are investigated in BiVO4, a widely investigated photocatalytic material. Using aberration-corrected scanning transmission electron microscopy (STEM), a kink configuration of the sharp ferroelastic twin wall with an altered electronic structure is revealed. Nanoscale conductivity measurements by conductive atomic force microscopy (c-AFM) show higher conductivity at twin walls compared to non-conductive bulk domains. Electronic structure investigation by electron energy loss spectroscopy (EELS) shows a higher density of oxygen vacancies and possible polaron accumulation at the wall. These findings reveal the electronic properties of BiVO4 domain walls, which are interesting for nanoscale-engineered catalytic concepts of BiVO4 and materials design for photochemistry-relevant applications.
| Original language | English |
|---|---|
| Article number | 2400420 |
| Number of pages | 8 |
| Journal | Advanced Functional Materials |
| Volume | 34 |
| Issue number | 33 |
| DOIs | |
| Publication status | Published - 14 Aug 2024 |
Keywords
- domain walls
- electronic properties
- microscopy
- spectroscopy
- topological defects