Evaluation of bone microarchitecture damage by press-fit implantation using digital volume correlation

Sophie Rapagna; Sanaz Berahmani; Karen Reynolds; Caroline Wyers; Joop van den Bergh; Gianluca Tozzi; Dennis Janssen; Egon Perilli

Evaluation of bone microarchitecture damage by press-fit implantation using digital volume correlation

Sophie Rapagna
, Sanaz Berahmani
, Karen Reynolds
, Caroline Wyers
, Joop van den Bergh
, Gianluca Tozzi
, Dennis Janssen
, Egon Perilli

College of Science and Engineering

Research output: Contribution to conference › Paper › peer-review

Original language	English
Publication status	Published - 2018
Event	8th World Congress of Biomechanics (WCB 2018) - Dublin, Ireland Duration: 8 Jul 2018 → 12 Jul 2018 Conference number: 8th http://wcb2018.com/ (Conference website)

Conference

Conference	8th World Congress of Biomechanics (WCB 2018)
Country/Territory	Ireland
City	Dublin
Period	8/07/18 → 12/07/18
Internet address	http://wcb2018.com/ (Conference website)

Cite this

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title = "Evaluation of bone microarchitecture damage by press-fit implantation using digital volume correlation",

author = "Sophie Rapagna and Sanaz Berahmani and Karen Reynolds and Caroline Wyers and \{van den Bergh\}, Joop and Gianluca Tozzi and Dennis Janssen and Egon Perilli",

year = "2018",

language = "English",

note = "8th World Congress of Biomechanics (WCB 2018) ; Conference date: 08-07-2018 Through 12-07-2018",

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TY - CONF

T1 - Evaluation of bone microarchitecture damage by press-fit implantation using digital volume correlation

AU - Rapagna, Sophie

AU - Berahmani, Sanaz

AU - Reynolds, Karen

AU - Wyers, Caroline

AU - van den Bergh, Joop

AU - Tozzi, Gianluca

AU - Janssen, Dennis

AU - Perilli, Egon

N1 - Conference code: 8th

PY - 2018

Y1 - 2018

UR - http://wcb2018.com/programme/

M3 - Paper

T2 - 8th World Congress of Biomechanics (WCB 2018)

Y2 - 8 July 2018 through 12 July 2018

ER -

Evaluation of bone microarchitecture damage by press-fit implantation using digital volume correlation

Conference

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Cite this