Skip to main navigation Skip to search Skip to main content

Formation of silicon carbide nanowire on insulator through direct wet oxidation

  • Hoang Phuong Phan
  • , Ginnosuke Ina
  • , Toan Dinh
  • , Takahiro Kozeki
  • , Tuan Khoa Nguyen
  • , Takahiro Namazu
  • , Afzaal Qamar
  • , Dzung Viet Dao
  • , Nam Trung Nguyen

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

Silicon carbide on insulator is a promising platform for electronic devices at high temperature as well as for opto-electrical applications. Utilizing the chemical inertness of SiC, this work presents a novel technique to form cubic-silicon carbide (3C-SiC) on silicon dioxide (SiO2) by using silicon wet-thermal-oxidation. Experimental data confirmed that SiO2 was successfully formed underneath of 300 nm width SiC nanowires, while the properties of SiC was almost unaffected during the oxidation process. This simple technique will open the pathway to the development of SiCOI (SiC on insulator) based electrical and optical applications.

Original languageEnglish
Pages (from-to)280-283
Number of pages4
JournalMaterials Letters
Volume196
DOIs
Publication statusPublished - 1 Jun 2017
Externally publishedYes

Keywords

  • LOCOS
  • MEMS
  • Nanowires waveguides
  • SiC nanowires
  • SiC on insulator
  • Silicon carbide

Fingerprint

Dive into the research topics of 'Formation of silicon carbide nanowire on insulator through direct wet oxidation'. Together they form a unique fingerprint.

Cite this