Abstract
Hospital readmissions are frequent and costly events. Early risk prediction can lead to more effective resource planning and utilization. This paper presents a deep learning framework for predicting the risk of 30-day all-cause readmission given a patient journey dataset. The problem is posed as a binary classification. A novel personalized self-adaptive feature learning and embedding strategy is applied to learn the representations of patient journeys. We first introduce a Variable Attention module to capture the interdependencies of clinical features and generate attention feature representations. We then place a convolutional neural network (CNN) on the generated feature representations to estimate outcome probabilities. Demographic features, including sex and age, are then incorporated into a personalized representation used for adaptively fixing the output of CNN by modifying the network loss function. We successfully predict 30-day all-cause risk-of-readmission with area-under-receiver-operating-curve (AUROC) ranging between 0.838 to 0.858 and overall maximum accuracy of 77.34%.
Original language | English |
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Pages (from-to) | 89-100 |
Number of pages | 12 |
Journal | Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) |
Volume | 13343 |
DOIs | |
Publication status | Published - 2022 |
Event | 35th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2022 - Kitakyushu, Japan Duration: 19 Jul 2022 → 22 Jul 2022 |
Keywords
- Attention mechanism
- Deep learning
- Readmission