Improved Method for Atomic Force Microscope Cantilever Calibration

Ashley Slattery; Christopher Gibson; Jamie Quinton

doi:10.1109/ICONN.2010.6045265

Improved Method for Atomic Force Microscope Cantilever Calibration

Ashley Slattery, Christopher Gibson, Jamie Quinton

Research output: Contribution to conference › Paper › peer-review

2 Citations (Scopus)

Abstract

The development of an improved method for calibrating AFM cantilevers is presented, based on the Cleveland method. A masking technique is used to deposit gold on the very end of the cantilever, and the shift in resonant frequency with added mass is used to calculate the spring constant. A novel and unique application of scanning Raman microscopy was developed to measure the thickness distribution of the deposited gold film over the cantilever. The uncertainty in the spring constant of cantilevers calibrated using this method was determined to be 10%, and in good agreement with established calibration methods in literature.

Original language	English
Pages	407-410
Number of pages	4
DOIs	https://doi.org/10.1109/ICONN.2010.6045265
Publication status	Published - 1 Dec 2010
Event	2010 International Conference on Nanoscience and Nanotechnology - Duration: 22 Feb 2010 → …

Conference

Conference	2010 International Conference on Nanoscience and Nanotechnology
Period	22/02/10 → …

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10.1109/ICONN.2010.6045265

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abstract = "The development of an improved method for calibrating AFM cantilevers is presented, based on the Cleveland method. A masking technique is used to deposit gold on the very end of the cantilever, and the shift in resonant frequency with added mass is used to calculate the spring constant. A novel and unique application of scanning Raman microscopy was developed to measure the thickness distribution of the deposited gold film over the cantilever. The uncertainty in the spring constant of cantilevers calibrated using this method was determined to be 10%, and in good agreement with established calibration methods in literature.",

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N2 - The development of an improved method for calibrating AFM cantilevers is presented, based on the Cleveland method. A masking technique is used to deposit gold on the very end of the cantilever, and the shift in resonant frequency with added mass is used to calculate the spring constant. A novel and unique application of scanning Raman microscopy was developed to measure the thickness distribution of the deposited gold film over the cantilever. The uncertainty in the spring constant of cantilevers calibrated using this method was determined to be 10%, and in good agreement with established calibration methods in literature.

AB - The development of an improved method for calibrating AFM cantilevers is presented, based on the Cleveland method. A masking technique is used to deposit gold on the very end of the cantilever, and the shift in resonant frequency with added mass is used to calculate the spring constant. A novel and unique application of scanning Raman microscopy was developed to measure the thickness distribution of the deposited gold film over the cantilever. The uncertainty in the spring constant of cantilevers calibrated using this method was determined to be 10%, and in good agreement with established calibration methods in literature.

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T2 - 2010 International Conference on Nanoscience and Nanotechnology

Y2 - 22 February 2010

ER -

Improved Method for Atomic Force Microscope Cantilever Calibration

Abstract

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