Improved Method for Atomic Force Microscope Cantilever Calibration

    Research output: Contribution to conferencePaper

    2 Citations (Scopus)

    Abstract

    The development of an improved method for calibrating AFM cantilevers is presented, based on the Cleveland method. A masking technique is used to deposit gold on the very end of the cantilever, and the shift in resonant frequency with added mass is used to calculate the spring constant. A novel and unique application of scanning Raman microscopy was developed to measure the thickness distribution of the deposited gold film over the cantilever. The uncertainty in the spring constant of cantilevers calibrated using this method was determined to be 10%, and in good agreement with established calibration methods in literature.

    Original languageEnglish
    Pages407-410
    Number of pages4
    DOIs
    Publication statusPublished - 1 Dec 2010
    Event2010 International Conference on Nanoscience and Nanotechnology -
    Duration: 22 Feb 2010 → …

    Conference

    Conference2010 International Conference on Nanoscience and Nanotechnology
    Period22/02/10 → …

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  • Cite this

    Slattery, A., Gibson, C., & Quinton, J. (2010). Improved Method for Atomic Force Microscope Cantilever Calibration. 407-410. Paper presented at 2010 International Conference on Nanoscience and Nanotechnology, . https://doi.org/10.1109/ICONN.2010.6045265