Fingerprint
Dive into the research topics of 'Interface electronic structure of Ta2O5–Al2O3 alloys for Si-field-effect transistor gate dielectric applications'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Interface electronic structure of Ta2O5–Al2O3 alloys for Si-field-effect transistor gate dielectric applications
MD Ulrich, RS Johnson, JG Hong, JE Rowe, G Lucovsky, JS Quinton, TE Madey
Research output: Contribution to journal › Article › peer-review
7
Citations
(Scopus)