Lateral force microscopy - A quantitative approach

Christopher T. Gibson, Gregory S. Watson, Sverre Myhra

Research output: Contribution to journalArticlepeer-review

46 Citations (Scopus)


The requirements for placing lateral force microscopy (LFM) on a quantitative basis are considered, with a view to enhancing the prospects for application in nanotribology. Methods for determining the critical parameters of the LFM system are reviewed and discussed (e.g. tip shape, detector sensitivity, normal and lateral spring constants of the force-sensing/loading lever, effective normal and lateral forces, and influence of topography). The emphasis is on exploitation of the capabilities inherent in the AFM/LFM system so as to obtain the relevant parameters and variables in situ during the conduct of an experiment.

Original languageEnglish
Pages (from-to)72-79
Number of pages8
Issue number1-2
Publication statusPublished - 30 Dec 1997
Externally publishedYes


  • Calibration
  • Friction
  • Lateral force microscopy
  • Scanned probe microscopy


Dive into the research topics of 'Lateral force microscopy - A quantitative approach'. Together they form a unique fingerprint.

Cite this