Limiting human perception for image sequences

Anthony J. Maeder, Joachim Diederich, Ernst Niebur

Research output: Chapter in Book/Report/Conference proceedingConference contribution

18 Citations (Scopus)

Abstract

Early vision processes, based on human visual system (HVS) performance, provide insufficient information for modeling our assimilation of image sequences (e.g. video). The use of a visual attention paradigm for modeling viewer response over time is advanced here. An 'importance map' of the scene can be constructed using both spatial and temporal information. The image quality of an individual frame can be degraded significantly using the importance map to predict typical foci of attention. Knowledge of the whole scene can be built up over many frames, by accumulating details represented at low quality in areas identified by the importance map as warranting less visual attention. We conjecture some limitations on the image quality and provide synthesized examples of scenes coded using this model.

Original languageEnglish
Title of host publicationHuman vision and electronic imaging
Subtitle of host publicationElectronic Imaging Science and Technology : 28 January-2 February 1996, San Jose, CA, United States
EditorsBernice E. Rogowitz, Jan P. Allebach
Pages330-337
Number of pages8
Publication statusPublished - 1996
Externally publishedYes
EventHuman Vision and Electronic Imaging - San Jose, CA, USA
Duration: 29 Jan 19961 Feb 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2657
ISSN (Print)0277-786X

Conference

ConferenceHuman Vision and Electronic Imaging
CitySan Jose, CA, USA
Period29/01/961/02/96

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  • Cite this

    Maeder, A. J., Diederich, J., & Niebur, E. (1996). Limiting human perception for image sequences. In B. E. Rogowitz, & J. P. Allebach (Eds.), Human vision and electronic imaging: Electronic Imaging Science and Technology : 28 January-2 February 1996, San Jose, CA, United States (pp. 330-337). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2657).