Abstract
A low drift nanomanipulation device operating in a scanning electron microscope was constructed. The device allowed to manipulate and to characterize the electrical properties of flexible and highly conductive gold nanowires with diameters down to 15nm. Individual nanowires could be electrically contacted either to substrate electrodes or to movable tip electrodes of the nanomanipulation device. Measuring the total resistance of a single nanowire at different lengths gave the intrinsic conductivity (σ ≈ 2.6 × 10 7 S/m) close to that of the bulk material (σ = 4.3 × 10 7 S/m). At high current densities the phenomenon of electromigration could be observed. The problem of spontaneous deposition of insulating layers on the gold objects from contaminations in the SEM chamber is addressed.
Original language | English |
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Pages (from-to) | 490-494 |
Number of pages | 5 |
Journal | Applied Surface Science |
Volume | 238 |
Issue number | 1-4 SPEC. ISS. |
DOIs | |
Publication status | Published - 15 Nov 2004 |
Externally published | Yes |
Event | APHYS 2003 - Badajoz, Spain Duration: 13 Oct 2003 → 18 Oct 2003 |
Keywords
- Electrical conductivity
- Electromigration
- Gold nanowire
- Nanomanipulation
- Scanning electron microscopy