Measuring the electronic structure of disordered overlayers by electron momentum spectroscopy: the Cu/Si interface

Kate Nixon, M Vos, C Bowles, Michael Ford

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Original language	English
Pages (from-to)	1236-1241
Number of pages	6
Journal	Surface and Interface Analysis
Volume	38
Issue number	8
Publication status	Published - 2006

Cite this

@article{819253d7a8764fd29f9ba53c9712e964,

title = "Measuring the electronic structure of disordered overlayers by electron momentum spectroscopy: the Cu/Si interface",

author = "Kate Nixon and M Vos and C Bowles and Michael Ford",

year = "2006",

language = "English",

volume = "38",

pages = "1236--1241",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "London; Philadelphia, PA: Heyden Son",

number = "8",

}