Measuring the electronic structure of disordered overlayers by electron momentum spectroscopy: the Cu/Si interface

Kate Nixon, M Vos, C Bowles, Michael Ford

    Research output: Contribution to journalArticle

    2 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)1236-1241
    Number of pages6
    JournalSurface and Interface Analysis
    Volume38
    Issue number8
    Publication statusPublished - 2006

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