Mechanical probing of ferroelectrics at the nanoscale

Y. Heo, P. Sharma, Y. Y. Liu, J. Y. Li, J. Seidel

Research output: Contribution to journalReview articlepeer-review

10 Citations (Scopus)

Abstract

Mechanical properties of ferroelectric materials at the nanoscale have received growing interest over the past years due to new developments in scientific instrumentation and novel materials that allow for the study of so far scarcely investigated and/or hidden nanoscale phenomena. The use of atomic force microscopy (AFM) as the main investigation tool has shed new light onto various areas of interest, from non-destructive probing of Young's modulus to mechanically triggered phase transitions at nanoscale regions in ferroelectrics. Together with various theoretical approaches, these scanning probe microscopy based concepts provide a powerful platform for nanoscale mechanical property studies. Here we provide an overview of recent developments and investigations, and give an outlook to future opportunities in this research area.

Original languageEnglish
Pages (from-to)12441-12462
Number of pages22
JournalJournal of Materials Chemistry C
Volume7
Issue number40
DOIs
Publication statusPublished - 28 Oct 2019
Externally publishedYes

Keywords

  • Atomic force microscopy
  • Elastic moduli
  • Nanotechnology
  • Scanning probe microscopy

Fingerprint

Dive into the research topics of 'Mechanical probing of ferroelectrics at the nanoscale'. Together they form a unique fingerprint.

Cite this