Abstract
The growth kinetics of surface films of propyltrimethoxysilane (PTMS) deposited on aluminum and iron oxide surfaces exhibit oscillatory adsorption. This phenomenon involves non-linear oscillations in surface coverage of the adsorbate, as measured by x-ray photoelectron spectroscopy (XPS), as a function of exposure time and solution concentration. In this paper, a mathematical model is presented to describe the experimentally observed time-dependent behaviour. The oscillatory nature of the adsorption can be modelled by a superposition of adsorption and desorption processes. The model quantitatively describes the rate and non-linearity of these processes. Using this model, the influence of the substrate upon the various adsorption processes is described quantitatively. A model for the physical origins of the three processes is presented.
| Original language | English |
|---|---|
| Pages (from-to) | 25-28 |
| Number of pages | 4 |
| Journal | Surface and Interface Analysis |
| Volume | 30 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - Aug 2000 |
| Externally published | Yes |
| Event | 8th European Conference on Applications of Surface and Interface Analisys, ECASIA 99 - Sevilla, Spain Duration: 4 Oct 1999 → 8 Oct 1999 |