Abstract
Nanomechanical properties of morphotropic BiFeO3 thin films are characterized at the nanoscale, using a combination of scanning probe microscopy techniques. Several key insights into the structural, mechanical, and electrical property correlations are presented. Besides, an approach employing nanomechanical force has been demonstrated to effectively control not only the structural transformation, but also electronic conductivity in a nonvolatile fashion.
Original language | English |
---|---|
Article number | 1600033 |
Number of pages | 8 |
Journal | Advanced Materials Interfaces |
Volume | 3 |
Issue number | 12 |
Early online date | 7 Mar 2016 |
DOIs | |
Publication status | Published - 21 Jun 2016 |
Externally published | Yes |
Keywords
- elastic modulus
- mechanical and electronic property correlations
- morphotropic phase boundaries
- multiferroic thin films
- transition yield strength