Novel Methods for Reflective Symmetry Detection in Scanned 3D Models

Matthew Stephenson, Adrian Clark, Richard Green

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The concept of detecting symmetry within 3D models has received an extensive amount of research within the past decade. Numerous algorithms have been proposed to identify reflective symmetry within 3D meshes and to extract a quantitative measure for the mo of symmetry. Much of the early work focuses on identifying symmetry in noiseless 3D models with most existing methods unable to work effectively on models distorted by noise, such as those commonly obtained when scanning objects in the real world. This report details the design and implementation of two robust and fast algorithms, which can be used on a wide variety of models to identify global approximate reflective symmetry. These methods are also able to identify likely planes of symmetry in models that have been distorted with noise or contain minor imperfections, making them ideal for scanned models of real world objects. The hypothesis planes are determined by principal component analysis, after which the proposed algorithms give each plane a numerical value corresponding to its likelihood of being a plane of global approximate reflective symmetry. The first algorithm uses the Hausdorff distance between vertices to estimate symmetry, whilst the second uses an approach based on ray casting.

Original languageEnglish
Title of host publication2015 International Conference on Image and Vision Computing New Zealand, IVCNZ 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages6
ISBN (Electronic)9781509003570
DOIs
Publication statusPublished - Nov 2015
Externally publishedYes
Event2015 International Conference on Image and Vision Computing New Zealand, IVCNZ 2015 - Auckland, New Zealand
Duration: 23 Nov 201524 Nov 2015

Publication series

NameInternational Conference Image and Vision Computing New Zealand
Volume2016-November
ISSN (Print)2151-2191
ISSN (Electronic)2151-2205

Conference

Conference2015 International Conference on Image and Vision Computing New Zealand, IVCNZ 2015
Country/TerritoryNew Zealand
CityAuckland
Period23/11/1524/11/15

Keywords

  • detection
  • models
  • reflective
  • scanned
  • symmetry

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