Pixel behaviour metrics for dynamic background modelling with the projected difference pattern method

Peter Pakulski, Karl Sammut, Amber He, Matther Naylor

Research output: Contribution to conference › Paper › peer-review

Original language	English
Publication status	Published - 2005
Event	IEEE Digital Imaging Computing: Techniques and Applications - Duration: 6 Dec 2005 → …

Conference	IEEE Digital Imaging Computing: Techniques and Applications
Period	6/12/05 → …

Cite this

@conference{deef5fcee1f34db3b6879b43935aee8b,

title = "Pixel behaviour metrics for dynamic background modelling with the projected difference pattern method",

author = "Peter Pakulski and Karl Sammut and Amber He and Matther Naylor",

year = "2005",

language = "English",

note = "IEEE Digital Imaging Computing: Techniques and Applications ; Conference date: 06-12-2005",

}