Polarized X-ray absorption spectroscopy and XPS of TiS3: S K- and Ti L-edge XANES and S and Ti 2p XPS

M. E. Fleet, S. L. Harmer, X. Liu, H. W. Nesbitt

Research output: Contribution to journalArticle

35 Citations (Scopus)

Abstract

Sulfur and Ti 2p XPS and polarized S K- and L2,3- and Ti L 2,3-edge XANES spectra have been obtained from oriented ribbon-like crystals of TiS3 grown by vapor transport. The S 2p XPS spectrum for (0 0 1) crystal faces has line widths of 0.53 eV and is completely accounted for by partially overlapped 2p3/2/2p1/2 doublets for sulfide (S2-) and disulfide (S22-) species, which are separate and independent entities in TiS3. Evidence of unsaturated surface states is lacking, consistent with a surface monolayer for the (0 0 1) growth face of disulfide atoms oriented with their charge-neutral sides outward. The S K-edge XANES spectra show pronounced anisotropy in the (0 0 1) plane of TiS3 crystals, associated with the photoelectron transition channel S 1s→3pxσ*u with the electric vector (E) parallel the a-axis (and the S-S bond of the disulfide group), and transitions to unoccupied antibonding orbitals of S-Ti bonds with E parallel to the b-axis (the direction of the well-known quasi-one-dimensional character of TiS3). The XPS and ultrasoft and soft X-ray region XANES spectra confirm the surface and near-surface structural integrity of TiS3.

Original languageEnglish
Pages (from-to)133-145
Number of pages13
JournalSurface Science
Volume584
Issue number2-3
DOIs
Publication statusPublished - 20 Jun 2005
Externally publishedYes

Keywords

  • Layered structures
  • Sulfides
  • TiS
  • X-ray absorption near edge spectroscopy
  • X-ray photoelectron spectroscopy

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