TY - JOUR
T1 - SCE, X-radiation sensitivity and mutation rate in multiple sclerosis
AU - Seshadri, Ram
AU - Sutherland, Grant R.
AU - Baker, Elizabeth
AU - Kutlaca, Robert
AU - Wigmore, Dianne
AU - Morley, Alexander A.
PY - 1983/6
Y1 - 1983/6
N2 - In order to detect any underlying DNA abnormality that may be present in multiple sclerosis (MS), the incidence of SCE, X-radiation sensitivity and the frequency of 6-thioguanine-resistant cells were determined in the lymphocytes of 34 MS patients. As a group, MS patients showed an increase in the SCE rate compared to control. However, there was no increase in X-radiation sensitivity. The frequency of 6-thioguanine-resistant mutant cells was also normal.
AB - In order to detect any underlying DNA abnormality that may be present in multiple sclerosis (MS), the incidence of SCE, X-radiation sensitivity and the frequency of 6-thioguanine-resistant cells were determined in the lymphocytes of 34 MS patients. As a group, MS patients showed an increase in the SCE rate compared to control. However, there was no increase in X-radiation sensitivity. The frequency of 6-thioguanine-resistant mutant cells was also normal.
UR - http://www.scopus.com/inward/record.url?scp=0020617047&partnerID=8YFLogxK
U2 - 10.1016/0027-5107(83)90023-4
DO - 10.1016/0027-5107(83)90023-4
M3 - Article
C2 - 6865993
AN - SCOPUS:0020617047
SN - 0027-5107
VL - 110
SP - 141
EP - 146
JO - Mutation Research - Fundamental and Molecular Mechanisms of Mutagenesis
JF - Mutation Research - Fundamental and Molecular Mechanisms of Mutagenesis
IS - 1
ER -