SCE, X-radiation sensitivity and mutation rate in multiple sclerosis

Ram Seshadri, Grant R. Sutherland, Elizabeth Baker, Robert Kutlaca, Dianne Wigmore, Alexander A. Morley

    Research output: Contribution to journalArticle

    5 Citations (Scopus)

    Abstract

    In order to detect any underlying DNA abnormality that may be present in multiple sclerosis (MS), the incidence of SCE, X-radiation sensitivity and the frequency of 6-thioguanine-resistant cells were determined in the lymphocytes of 34 MS patients. As a group, MS patients showed an increase in the SCE rate compared to control. However, there was no increase in X-radiation sensitivity. The frequency of 6-thioguanine-resistant mutant cells was also normal.

    Original languageEnglish
    Pages (from-to)141-146
    Number of pages6
    JournalMutation Research - Fundamental and Molecular Mechanisms of Mutagenesis
    Volume110
    Issue number1
    DOIs
    Publication statusPublished - Jun 1983

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