TY - JOUR
T1 - Specific Conductivity of a Ferroelectric Domain Wall
AU - Sharma, Pankaj
AU - Morozovska, Anna N.
AU - Eliseev, Eugene A.
AU - Zhang, Qi
AU - Sando, Daniel
AU - Valanoor, Nagarajan
AU - Seidel, Jan
PY - 2022/6/28
Y1 - 2022/6/28
N2 - The small size of ferroelectric domain walls (FEDWs) presents a significant challenge for the accurate determination of their electrical properties. Quantification of their specific conductivity (σ), however, is essential for their implementation as functional elements and interconnects in nanoelectronic circuits. Here, we propose a scanning-probe-based method to directly determine the specific conductivity of a single FEDW in an insulating ferroelectric. The method eliminates complications due to size, current magnitude, and non-Ohmic electrical contacts. Transmission line spectroscopy measurements coupled with mean-field theory are able to provide quantitative insight into domain wall conductivity, shown here for prototypical 71° FEDWs in BiFeO3. These results provide significant insight into FEDWs, bringing applications in future nanoelectronic devices a step closer.
AB - The small size of ferroelectric domain walls (FEDWs) presents a significant challenge for the accurate determination of their electrical properties. Quantification of their specific conductivity (σ), however, is essential for their implementation as functional elements and interconnects in nanoelectronic circuits. Here, we propose a scanning-probe-based method to directly determine the specific conductivity of a single FEDW in an insulating ferroelectric. The method eliminates complications due to size, current magnitude, and non-Ohmic electrical contacts. Transmission line spectroscopy measurements coupled with mean-field theory are able to provide quantitative insight into domain wall conductivity, shown here for prototypical 71° FEDWs in BiFeO3. These results provide significant insight into FEDWs, bringing applications in future nanoelectronic devices a step closer.
KW - domain walls
KW - ferroelectrics
KW - scanning probe microscopy
KW - specific conductivity
KW - transmission line spectroscopy
UR - http://www.scopus.com/inward/record.url?scp=85131884744&partnerID=8YFLogxK
UR - http://purl.org/au-research/grants/ARC/CE170100039
U2 - 10.1021/acsaelm.2c00261
DO - 10.1021/acsaelm.2c00261
M3 - Article
AN - SCOPUS:85131884744
SN - 2637-6113
VL - 4
SP - 2739
EP - 2746
JO - ACS Applied Electronic Materials
JF - ACS Applied Electronic Materials
IS - 6
ER -