Structural, magnetic, and ferroelectric properties of T-like cobalt-doped BiFeO3 thin films

T. Young, P. Sharma, D. H. Kim, Thai Duy Ha, Jenh Yih Juang, Y. H. Chu, J. Seidel, V. Nagarajan, S. Yasui, M. Itoh, D. Sando

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)
75 Downloads (Pure)

Abstract

We present a comprehensive study of the physical properties of epitaxial cobalt-doped BiFeO3 films ∼50 nm thick grown on (001) LaAlO3 substrates. X-ray diffraction and magnetic characterization demonstrate high quality purely tetragonal-like (T′) phase films with no parasitic impurities. Remarkably, the step-and-terrace film surface morphology can be fully recovered following a local electric-field-induced rhombohedral-like to T′ phase transformation. Local switching spectroscopy experiments confirm the ferroelectric switching to follow previously reported transition pathways. Critically, we show unequivocal evidence for conduction at domain walls between polarization variants in T′-like BFO, making this material system an attractive candidate for domain wall-based nanoelectronics.

Original languageEnglish
Article number026102
Number of pages7
JournalAPL Materials
Volume6
Issue number2
DOIs
Publication statusPublished - 1 Feb 2018
Externally publishedYes

Keywords

  • ferroelectric properties
  • BiFeO3

Fingerprint

Dive into the research topics of 'Structural, magnetic, and ferroelectric properties of T-like cobalt-doped BiFeO3 thin films'. Together they form a unique fingerprint.

Cite this